Metallurgical Microscope
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BS-6020TRF Laboratory Metallurgical Microscope
BS-6020RF/TRF metallurgical microscopes are high level professional microscopes which are specially designed for metallurgical analysis. With excellent optical system, ingenious stand and convenient operation, they will be your best choice.
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BS-6006B Binocular Metallurgical Microscope
BS-6006 series metallurgical microscopes are basic level professional metallurgical microscopes which are specially designed for metallurgical analysis and industrial inspections. With excellent optical system, ingenious stand and convenient operation, they can be widely used in industrial areas for PCB board, LCD display, metal structure observation and inspection. They also can be used in colleagues and universities for metallography education and research.
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BS-6005D Trinocular Inverted Metallurgical Microscope
BS-6005 series inverted metallurgical microscopes adopt professional metallurgical objective and plan eyepiece to provide superior image, high resolution and comfortable observation. They combine bight field, dark field and polarizing observation. They are widely used in teaching and research of metallographic analysis, semiconductor silicon wafer inspection, geology mineral analysis, precision engineering and similar fields.
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BS-6006T Trinocular Metallurgical Microscope
BS-6006 series metallurgical microscopes are basic level professional metallurgical microscopes which are specially designed for metallurgical analysis and industrial inspections. With excellent optical system, ingenious stand and convenient operation, they can be widely used in industrial areas for PCB board, LCD display, metal structure observation and inspection. They also can be used in colleagues and universities for metallography education and research.
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BS-6005 Trinocular Inverted Metallurgical Microscope
BS-6005 series inverted metallurgical microscopes adopt professional metallurgical objective and plan eyepiece to provide superior image, high resolution and comfortable observation. They combine bight field, dark field and polarizing observation. They are widely used in teaching and research of metallographic analysis, semiconductor silicon wafer inspection, geology mineral analysis, precision engineering and similar fields.